Document wg1dmy78gv3w9RDpq4OY1MkQV
CONFIDENTIAL
Approved.
f Date MAP. 2 fi 1953
MELLON INSTITUTE OF INDUST
ftftSFARCH ^
DEPARTMENT OF RESEARCH IN CHE
Fellow.
Project
Mr. J. f. Morgan X-Ray Analysist Johns-Maaville
Project No..
Date of Report
2S9-1S* March 26, 1953
Preliminary
1 progress--- pinal ---------;
PLAINTIFF'S EXHIBIT
Saaple Fill go. 2, ?SOTk.
1HF-414
Tha crystallinity as estimated from the intensity of tbs lints on
ths x-ray diagraa is about 500. Tbs aajor crystelliat component Is KC1 vlth possibly a snail anount of SsCl sad sons unidsstifisd material.
This sample is approximately 1000 crystalline. The crystalline portion of the saaple is made up of 3 parts CaCQs to about 1 part Ca silicate. The exact chemical formula for the silicate could not be determined. The best agreement vlth ths data uas given toy 3Ca0*26i0i and 72Ca0*B10fc.
Sample IHF-Feldspar ^lOm., F-BOflO.
Ths diffraction diagram of this saaqile agrees exactly vlth the data given in the Eanavalt card fils for aicrocllne feldspar (card 1-07D5).
C e rtify This Copy T o Be A True and Exact Copy o f the O riu in a l House In the
Douglas T. Pitman t . Leroy I. Alexander*
3-26-53
(j RESEARCH ASSWIATf
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