Document G60YZbQNk7O9ydeEGgXgyeVmY

388 K. StSHAN focused to obtain the diffraction pattern shown in Fig. 3b. The resulting beam damage is shown in Fig. 3c. The use of beam sensitivity to distinguish chrysolite from other non-beam-sensitive materials, e g., the amphiboles, has been dis cussed by Langere/ al. (1974). Dark- and bright-field images of deformed UICC standards (B) are shown in Figs. 4a-4c). The effects of deformation are clearly seen in the dark field images (4a and 4b) and in the electron diffraction patterns but not in the bright-field I Pic. 5. Sample (C): Bumithing dust from so automobile brake drum prior to inatallation. (a) Dark field, (b) diffraction pattern, and (c) bright field. Notice the well-preserved canal which show* up (the dark-field image) i# (a), indicated by the arrow and arrowhead. Thia and the well-preserved diffraction pattern (b) shows that the fiber* are not a* deformed a the UICC aampie*--a conclusion that cannot be inferred from the bright-field image (c). 80 3Stfd Aatfaan sonsids 2Z82-96S-2IE 8S-'SI 1002/80/01